Ex-Showroom Offer: Tesa-Scan 52 Measuring span for diameters (mm) 0,5 ÷ 52 Measuring span for lengths (mm) 300, Max. perm. error for diameters (µm) 2 + D/100

TESA-SCAN 52 REFLEX-Click is the fruit of a long expertise acquired both in optical
measurement of cylindrical parts and in metrology-based applications for industry where
this way of inspecting parts is required. This has led to
the development of a dedicated system that is definitely
innovative whilst opening new ways for part inspection
on the shop floor.
Two versions are currently available. One can perform
static measurement, whilst the other equipped with
a rotary headstock is able to execute both static and
dynamic measurements.

TESA-REFLEX Scan provides Users with two new functionalities. A single press on
the REFLEX-Click button located on the front face of the machine will enable them.
1 Direct measurement of parts without the need for any preliminary programming:
the machine will scan the part, and then restore each main feature based on a default
protocol. This is particularly convenient when inspecting single provided parts in
self-service.
2 Automatic recognition of the parts: as the part is being scanned, the software will
determine whether a programme matching the part geometry already exists. If so,
this programme will be loaded and the results computed against nominal values
obtained from all inspection operations.
Both functionalities are proper to the TESA-REFLEX and unique to date, making this
software incomparable to any other in terms of user-friendliness and effectiveness for
part inspection in the workshop

Technical Data
Order number 02430090 / 02430091*
Measuring span for diameters (mm) 0,5 ÷ 52
Measuring span for lengths (mm) 300
Max. workpiece weight (kg) 4
Software TESA-REFLEX Scan
Machine’s dimensions, X/Y/Z (mm) 1000 x 435 x 840
Machine’s weight (kg) 103
Precision (D and L in mm, 20°C ±1°C)
Max. perm. error for diameters (µm) 2 + D/100
Max. perm. error for lengths (µm) 5 + L/100
Repeatability limit for diamters (µm) 1
Repeatability limit for lengths (µm) 2,5
* Static or dynamic measurement