Description
- This dual system with a non-contact displacement sensor has a scanning function that enables measurement of minute height differences and 3D shapes.
- The non-contact displacement sensor (CPS probe) uses the wavelength confocal method.
- The LED used as the light source of the displacement sensor has an auto-brightness control function that enables seamless measurement of materials with different reflectivity.
No technical information is currently available.
No application information is currently available.
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